Troubleshooting Electronics

Troubl1This class is designed as a practical, industrial-applied session for electrical engineers and electronics technicians who would like to learn powerful, effective troubleshooting techniques of electronic circuits and systems, enabling them to continually enhance their troubleshooting skills and proficiency.

They will leave with a better understanding and an increased knowledge of the many valuable troubleshooting methods and best practices, as well as useful hints and tips that will help them to efficiently and successfully perform their work.

We understand your work is important to you and that you want the right training which meets your requirements. Therefore, we offer the flexibility to customize our training to address your specific needs.  Although a standard agenda is established for each class, on the first day of training, we will inquire you about your work, what you already know, and what you would like to learn so that we can tailor the class to your precise applications, as necessary. We want to provide you with the best, value-added training available, that is advantageous to you and to your organization.

SAFETY:

Capacitor store charge, isolation transformer, voltage ratings on leads, floating a scope ground, laser, voltage measurement, use of Digital Multimeter (DMM), lock out tag out, etc.

FAILURE SYMPTOMS & FAILURE CAUSES:

Visual inspection, use of the five senses, manufacturing defects, infant mortality, Electrostatic Discharge (ESD), Electrical Overstress (EOS), etc.

TROUBLESHOOTING BASICS:

Equipment plugged in, powered on, fuse / circuit breaker, wall breaker, Ground Fault Circuit Interrupter (GFCI) verified, emergency stop switch off, intermittent failure due to cold solder joint, loose connection, proper documentation with revision level matching Unit Under Test (UUT), etc.

TEST EQUIPMENT (FEATURES & BENEFITS):

Ohmmeter, continuity meter, diode checker, Inductance-Capacitance-Resistance (LCR) meter, Digital Voltmeter (DVM), oscilloscope, logic analyzer, boundary scan, Manufacturing Defects Analyzer (MDA), spectrum analyzer, logic probes, fault dictionary, circuit simulation, in-circuit tester, emulators, function generator, Arbitrary Waveform Analyzer (AWG), signature analyzer, Environmental Stress Screening / Highly Accelerated Stress Screening / Highly Accelerated Life Testing (ESS/HASS/HALT), functional, hi-pot, and ground continuity testers

FAILURE TYPES:

ESD, cold temperature, temperature transition, vibration, altitude, humidity, etc.

CURRENT & VOLTAGE MEASUREMENT:
  • Low impedance, in-line, inductive - AC & DC
  • Loading circuit, AC & DC, ripple, 1M resistor divider, speed & frequency maximum 
LATCH-UP REVIEW:

Latch-up examples, causes for latch-up, latch-up test analysis, latch-up failure analysis, latch-up circuit analysis, latch-up prevention

USING TEMPERATURE FOR TESTING & TROUBLESHOOTING:

Infrared thermometer, "Finger" test, liquid crystal paper

TROUBLESHOOTING DISCUSSION:
  • Op-amp, microprocessor, Programmable Logic Device (PLD), FLASH, parasitic components, resistor, capacitor, thermocouple, thermistor, fuse, switch,  circuit breaker, multivibrator, etc.
  • Noise, power supply, RS-232, EMC, cross-talk, ground loops, transmission line, hardware, software, firmware, PLD programming, I/O control, etc.
  • Device compatibility, Low Voltage Differential Signaling (LVDS), low-volt logic, CMOS power dissipation, bus-hold features, derating guidelines, built-in test, failure analysis, etc.
BOUNDARY SCAN TESTING (BST):

Joint Test Action Group (JTAG) testing, IEEE 1149.1, boundary scan, scan cells & registers, instruction registers, Design For Testability (DFT) philosophy, Automatic Test Generation (ATG), BST benefits

PRINTED CIRCUIT BOARD (PCB) TESTING:

Bed of nails, scope probes, DIP clips, SMT clips, pin pitch, Application Specific Integrated Circuit (ASIC)

POWER SUPPLY:

Switching power supply (input & output blocks, control block, and power block), linear power supply, linear regulator, inverter vs. converter, Common Mode Choke (CMCh), Pulse Width Modulator (PWM), Field-Effect Transistor (FET), power fail interrupt, multiple outputs 

DESIGN FOR TESTABILITY:

Correct insertion of ground & test points, circuit partitioning, different fault types, functional testing, in-circuit testing,   purpose & function of ICT analog guarding, non-functional back-driving, use of logic probes, logic pulsers, current probes, logic analyzers, oscilloscopes, etc.

Class Details

Tuition: $2,925 per student (plus the appropriate NMGRT if taught in New Mexico), where NMGRT = New Mexico Gross Receipt Tax

Prerequisite: Our Advanced Electronics training class or equivalent knowledge and/or experience in electronics

Target audience: Technicians, engineers, managers

Instructor: Jay Skolnik, PE (Professional Licensed Electrical Engineer & ESD Program Manager Certified by ESD Association & iNARTE ESDC Certified & IPC ESDC Certified Instructor & Active Member of ESD Association & Certified ESD Specialist / Plant Auditor & Certified ESDA TR53 Technician by ESDA & Certified Professional Instructor (CPI) for National Instruments (NI) Multisim & Ultiboard programs)

Related classes:  Advanced Electronics

Class length: 3 days

Class size: 15 minimum

Class time: 8:30 AM to 5 PM (Mountain Time).   There is a 1-hour lunch (not included) scheduled from 12 PM to 1 PM daily.   There are 10-minute stretch breaks periodically throughout the day.

Class location: Please refer to the emailed registration confirmation that you received from Skolnik Tech upon your completion of class registration.  Thank you. 

What to bring: Pen/pencil and paper to take notes, and a calculator if you have one

What to wear: Casual, comfortable clothes

Inclement weather:  Should we experience inclement weather at any time during the training period, please check our web site at www.skolnik-tech.com or call us at (505) 299-1157 early in the morning on the class date prior to start of class for instructions regarding the training schedule for that particular class date.  Thank you.

Various Comments from Past Attendees

"Very detailed  class - Good coverage of most of all the electronic applications!  It covered many issues and is to the point.  I highly recommend this course for engineers and technicians at Honeywell."
Technician - Honeywell  

"The new troubleshooting approaches & techniques that were introduced in class are valuable.  I do learn a lot from your class."
Technologist - Sandia National Laboratories 

"What a great class! I really enjoyed just about everything.  It really helped clear out a few cobwebs & helped me see things with a different perspective."
Technician - Honeywell 

"The instructor is very knowledgeable about the materials and was able to relate them to real-world uses, as well as made the class fun and interesting."
Technician - Los Alamos National Laboratory 

"Very complete class - The basic theories were discussed as well as the more advanced and abnormal scenarios were examined."
Technologist - Sandia National Laboratories

"Class was presented very, very well - Good review and practical use of theory as well as hands-on. It was also enjoyable and easy to pay attention to!"
Technician - Los Alamos National Laboratory  

"Studying the useful functions and powerful features / benefits of the oscilloscope will definitely help me with my troubleshooting analyses."
Technologist - Sandia National Laboratories 

"Excellent class!  I learned many new and very good hints & tips."
Technician - Honeywell  

 
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